Hello, everybody.I'm new to the LVOOP and I meet a problem in my wafer auto-test system about the class responsibility.
the wafer auto-test system uses many instruments to measure the wafer parameters such as Vbr, Vf... Firstly, I want build class for every instrument. For example, I have create a app class named WaferTester, and many instrument classes such as Keithy 2600B class, EXFO PM1600 class, etc. The WaferTester class contains these instrument classes. However, I also want to create parameter class such as Vbr class, Vf class. These parameter class have many properties such as test delay time, upper limit, lower limit etc. Most importantly, the parameter class have a method to get parameter measurement result. For example, when calling the measure method of Vbr class, it use instrument to measure the Vbr parameter of the wafer and return it to the caller. My question is about the relationship the instrument class and the parameter class. The method of parameter class will use different instrument classes, so the instrument classes is a part of the parameter class. For example, the Vbr class will contain Keithy 2600B class. However, different parameter class may use the same instrument and I think the instrument is a static part of the test system. I have no idea to achieve a reasonable relationship about the parameter class and the instrument class.